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Microbubble Cleaning Platform- Advanced Contamination Control for Semiconductor Applications

Microbubble Cleaning Platform- Advanced Contamination Control for Semiconductor Applications

Utilizing controlled microbubble dynamics to enhance particle detachment, surface cleaning efficiency, and chemical reduction in semiconductor processes.
詳細介紹


 

Technology Principle

Microbubble cleaning leverages the physical and interfacial behavior of micron-scale gas bubbles in liquid systems to enhance contamination removal.

When microbubbles interact with solid surfaces:

  • Bubble surface charge interacts with particles

  • Interfacial tension changes at the surface

  • Microbubble collapse induces localized micro-flow

  • Adsorbed contaminants are detached

Compared to conventional chemical cleaning, microbubble systems:

  • Reduce chemical dependency

  • Lower surface damage risk

  • Improve removal of sub-micron particles

  • Support environmentally optimized processes


Core Mechanisms

1. Electrostatic Interaction

Charged microbubbles attract oppositely charged particles, enhancing detachment efficiency.

2. Interfacial Tension Reduction

Gas-liquid interfaces weaken adhesion forces between particles and substrate surfaces.

3. Microstreaming & Local Flow Disturbance

Bubble collapse generates localized micro-currents improving boundary layer disruption.

4. Enhanced Mass Transfer

Improves oxidant or reactive species contact efficiency (if combined with O₂ or chemistry).


System Architecture

A typical microbubble cleaning module includes:

  • Gas control unit (O₂ / N₂ / CO₂ optional)

  • Microbubble generator (venturi / porous diffuser / cavitation-based)

  • Temperature control (optional 40–80°C)

  • Flow stabilization chamber

  • Recirculation or single-pass configuration

  • Waste or reclaim management

System design options:

  • Inline module integration

  • Standalone tank system

  • FOUP internal cleaning integration

  • Chemical loop enhancement


Semiconductor Applications

▸ Wafer Surface Pre-Clean

Removes particles before wet process or deposition.

▸ Chemical Line Cleaning

Enhances contamination removal inside PFA / PVDF tubing systems.

▸ FOUP & Carrier Cleaning

Reduces organic & particle contamination inside storage carriers.

▸ Filter Regeneration Assistance

Assists in removal of loosely bound contaminants.

▸ IPA / Acid Process Optimization

Enhances cleaning efficiency while reducing chemical usage.


Performance Metrics

Typical evaluation parameters include:

  • Particle removal efficiency (%)

  • LPC particle count reduction

  • TOF-MS background reduction

  • Contact angle variation

  • Surface integrity (SEM)

  • ORP / DO monitoring (if oxidant involved)

 

Advantages

✓ Lower chemical consumption
✓ Reduced surface damage risk
✓ Environmentally optimized process
✓ Scalable to large systems
✓ Compatible with existing wet benches

Optional Advanced Modes

  • O₂ Microbubble Oxidation Mode

  • CO₂-assisted Cleaning

  • Hybrid Microbubble + Chemical Mode

  • Heated Microbubble System (60–80°C)

  • Fast-loop Inline Enhancement

Qualification Flow

  1. Process requirement definition

  2. Bubble size distribution confirmation

  3. Pilot test (bench scale)

  4. Particle & chemical analysis

  5. Surface integrity evaluation

  6. Scale-up implementation